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- Excillum and Bruker AXS Announce Collaboration to Develop X-ray Diffraction Solutions based on Novel Extremely Bright X-ray Source
- Lab Report XRF 96 S8 TIGER Analysis fo Pb and Cd in Lead-Free Solder for ROHS Compliance Testing
- Successful AXS CEM 2010 in Karlsruhe
- FREE Crystal Structures!
- Bruker Elemental Announces Q2 ION Ultra-Compact Metals Analyzer
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Mar 20-23, Orlando, Florida, USA - IM20
Mar 21-24, Miami, Florida, USA - ACS Spring
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March 23-26, Munich, Germany - BCA
April 12-15, Warwick, Great Britain - Control 2010
May 04-07, Stuttgart, Germany
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NANOS N8 Products - Instruments and Workstations
NANOS - High Resolution for your optical Microscope
NANOS is a compact, full fledged AFM that adds quantitative measuring capabilities and high resolving power to your optical microscope and inspection tool.
N8 ARGOS - AFM / SPM the easy way
The N8 ARGOS is a compact and highly rigid stand for the NANOS AFM/SPM system. Equipped with a ultra precision vertical stage the AFM is approached with nanometer accuracy.
N8 NEOS - The optimized surface inspection system
The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized setup.
N8 RADOS - AFM / SPM for automated surface inspection
N8 RADOS combines a high quality research microscope, a scriber, and our NANOS AFM on an automated platform.
N8 TITANOS - Fully automated, ultra-high Precision AFM Inspection Now demonstrating atomic Resolution!
The new N8 TITANOS air-bearing stage for nanometer scale inspection of 300 mm wafers, masks and other large samples is the result of more than a decade in AFM/SPM development
More information
Uniques features of the NANOS AFM / SPM products
NANOS N8 Series (PDF brochure) – Scanning Probe Microscopes
View AFM webinar Small Things, Big Differences: Bruker Nano AFMs (video presentation)
Download AFM webinar presentation Small Things, Big Differences: Bruker Nano AFMs (PDF presentation slides)






