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News
- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
NANOS – High Resolution for your OEM application
- NANOS
NANOS is a compact, fully fledged AFM that adds quantitative measuring capabilities and high resolving power to your OEM application.
NANOS is the ideal partner for your OEM purpose. The measuring head, including mount, approximates a normal microscope objective in size and shape - and yet is a complete scanning probe microscope.
Enter fascinating nanosphere with your microscope in the blink of an eye. NANOS can be adapted to retrofit all common types of optical microscopes.
