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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
NANOS – High Resolution for your OEM application
- NANOS
NANOS is a compact, fully fledged AFM that adds quantitative measuring capabilities and high resolving power to your OEM application.
NANOS is the ideal partner for your OEM purpose. The measuring head, including mount, approximates a normal microscope objective in size and shape - and yet is a complete scanning probe microscope.
Enter fascinating nanosphere with your microscope in the blink of an eye. NANOS can be adapted to retrofit all common types of optical microscopes.
