Atomic Force Microscopy

N8 RADOS Specifications

   
Scan range 80 µm x 80 µm x 5 µm, hardware linearized scan, motion in X-Y-direction (optional in Z-direction)
Noise level < 0,1 nm rms in vertical direction (Z)
Max. sample size 95 mm diameter (R-θ stage) 100 mm square (X-Y stage)
SPM modes all modes applicable, refer to Techniques
Tip change adjustment free
Microscope Zeiss Axiotech optional with bright/dark field and differential interference contrast (DIC)
Position resolution rotary stage 10 mgrad
Accuracy of rotary stage ± 8 mgrad
Position resolution translation stage 0.5 µm
Accuracy of translation stage ± 2 µm
Deviation between optical and AFM position < 2 µm
Scriber Diamond tip with sensor controlled load force
Enclosure Active antivibration, noise shield
Operating system MS-Windows 2000®, XP, Vista
Footprint 800 mm x 800 mm, height 1800 mm
System weight approximately 250 kg