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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
N8 RADOS Specifications
| Scan range | 80 µm x 80 µm x 5 µm, hardware linearized scan, motion in X-Y-direction (optional in Z-direction) |
| Noise level | < 0,1 nm rms in vertical direction (Z) |
| Max. sample size | 95 mm diameter (R-θ stage) 100 mm square (X-Y stage) |
| SPM modes | all modes applicable, refer to Techniques |
| Tip change | adjustment free |
| Microscope | Zeiss Axiotech optional with bright/dark field and differential interference contrast (DIC) |
| Position resolution rotary stage | 10 mgrad |
| Accuracy of rotary stage | ± 8 mgrad |
| Position resolution translation stage | 0.5 µm |
| Accuracy of translation stage | ± 2 µm |
| Deviation between optical and AFM position | < 2 µm |
| Scriber | Diamond tip with sensor controlled load force |
| Enclosure | Active antivibration, noise shield |
| Operating system | MS-Windows 2000®, XP, Vista |
| Footprint | 800 mm x 800 mm, height 1800 mm |
| System weight | approximately 250 kg |

