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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
N8 RADOS
- R-θ Version
To localize and identify defects on hard disks, wafers and DVDs/CDs, samples are usually measured with optical inspection tools, marked, and then transferred to an AFM, often in a different lab and/or with a different user. With the N8 RADOS, you can perform all of these steps with one single tool. Our system combines a high quality research microscope, a scriber, and our NANOS AFM on an automated platform.
The result? After locating a position on your sample, press one button to move the sample to the AFM and then begin your scan. After scanning, you can press another button to scribe the location on your sample.
The N8 RADOS is available in two versions
- The R-θ version is for circular samples, like hard disks and wafers
- The X-Y version is for rectangular samples, like masks, pole tips and microchips
- X-Y Version
The system places a microscope, our AFM, and a scriber on one solid platform, which then utilizes precision translation and rotary stages to guarantee that AFM scans are centered precisely on your region of interest. The scriber allows you to mark the ROI for future reference.
