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News
- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
NEOS Setup
- NEOS
- Integrated NANOS AFM
The NEOS is a perfectly hybridized tool. It was designed focusing on ease of use in combination with best optical and AFM performance with the look and feel of a classical optical microscope. The rigid granite stand provides the stability required for AFM, the handling of the optical components and the NANOS AFM scanning head is intuitive and straight forward.
The NEOS uses fiber-optic interferometry (FOI) as the basic principle for the detection of cantilever deflection, providing superior sensitivity combined with a truly calibrated measurement of the cantilever’s deflection and amplitude, respectively.
The NEOS implements Bruker’s unique adjustment-free cantilever and probe exchange system that makes probe replacements quick and simple. It makes the laser adjustment after tip exchange needless providing best ease of use.
The integrated concept includes an easy to use control and evaluation software.
