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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
NEOS SENTERRA
- NEOS SENTERRA
The NEOS SENTERRA is the new combination of the most flexible NEOS Scanning Probe Microscope with Bruker's SENTERRA Raman microscope.
Combined AFM and Raman microscopy
The instrument provides high resolution topography measurements at the molecular level with the capability to perform chemical analysis by Raman spectroscopy. NEOS SENTERRA facilitates to study the region of interest of any sample by AFM and Raman subsequently, without a dislocation of the sample in-between. Many different laser excitation lines are available for the SENTERRA which provides a very high sensitivity and wavelength stability.
NEOS SENTERRA is the solution for co-located AFM-Raman measurements
- Dedicated Bruker AFM and Bruker Raman capability combined
- Easy sample handling without transfer between methods
- Provides high productivity for data correlation
- Compact design with small footprint
Single source integration benefits
- Ease of use for both AFM & Raman
- Clean integration between units
- Fast simple, AFM & Raman co-localized measurement
Raman benefits
- High spectral resolution, suitable for many applications
- Sure_Cal® for continuous Raman calibration
- Easy switching between different laser wavelengths
- Various tools for efficient fluorescence reduction
