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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Multi-Channel Detectors for EDS on SEM – Free Webinar
- XFlash® QUAD 5040 and XFlash® 5030
For many years Bruker has pioneered the design and production of multi-SDD systems and multi-channel SD detectors for EDS on scanning electron microscopes and microprobes. In this webinar we want to show which systems are currently available from Bruker and what their benefits are. The webinar will therefore contain a multitude of application examples.
During the first part of the webinar we will talk about multi-detector setups– systems containing two to four detectors on a microscope. Using multiple detectors has a number of advantages including the increase of solid angle, which is especially important when analyzing sensitive samples or, alternatively, for high count rate or throughput applications. Another advantage is the reduction of shadowing, when dealing with samples that have a rough surface. The discussion of multidetector systems will be rounded off with various application examples.
Multi-channel detectors and their practical applications will be discussed in the second part of the webinar. Bruker currently offers two four-channel detectors: the conventional XFlash® QUAD 5040 (four 10 mm² SDDs on a single chip) and the annular XFlash® QUAD 5060F (four 15 mm² SDDs), which is positioned between microscope pole piece and sample. The XFlash® QUAD 5040 provides the best resolution at highest count rates of any EDS detector on the market to date. The XFlash® QUAD 5060F is the detector that offers the largest solid angle in electron microscopy; in this way, it is predestined for the analysis of sensitive samples at low beam currents and accelerating voltages.
