• About Us
  • Products
  • Solutions
  • Service & Support
  • News
  • Offices
  • Home
  • Contact
  • Career
  • Events
  • Introduction
  • Product finder
  • X-ray Spectrometry
  • Handheld X-ray Spectrometry
  • Optical Emission Spectrometry
  • Combustion Analysis
  • X-ray Microanalysis
  • X-ray Diffraction
    • Introduction
    • D2 CRYSO
    • D4 ENDEAVOR
    • D8 FOCUS
    • D8 ADVANCE
    • D8 DISCOVER
    • D8 FABLINE
    • D8 DISCOVER with GADDS
    • D8 DISCOVER with GADDS HTS
    • NANOSTAR
    • SUPER SPEED SOLUTIONS
    • Software
      • BASIC Measurement Package
      • EVA
      • SEARCH
      • BASIC Part 11
      • TOPAS
      • DIFFRACplus TEXTURE
      • DIFFRACplus ODF
      • MULTEX
      • MULTEX AREA
      • LEPTOS
      • ELASTIX
      • STRESS
      • PolySNAP
      • SNAP-1D
      • dSNAP
      • GADDS
    • Documents
    • Accessories
    • Excellence in X-ray Diffraction Scholarship
  • Biological Crystallography
  • Chemical Crystallography
  • Radionuclide Analysis
  • Lab Automation
  • X-ray Components
  • Special Offers

Language

  • select language
    • English
    • German
    • Spanish

Search

  Register now

Product News

  • Bruker AXS Introduces the D2 CRYSO™ System, a Large Crystal Orientation Analyzer Based on Novel ED-XRD Technology

Upcoming Events

  • Denver X-ray Conference

MULTEX AREA

MULTEX AREA is an easy-to-use software instrument for the entire process of texture investigation using a 2D detector. It features planning of measurement strategies, calculating and analysing of pole figures, and an extended background handling to treat data obtained with a 2D detector allowing the measurement of several diffraction lines simultaneously. Pole figures can be exported for further analysis using MULTEX or ODF.


MULTEX


ODF

 
Bruker Biospin | Bruker Daltonics | Bruker Optics
© 2008 Bruker AXS | Sitemap | Imprint | Investor Relations | Updated on 19.07.2008
 Back to top | Print this page