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  • Bruker AXS Introduces the D2 CRYSO™ System, a Large Crystal Orientation Analyzer Based on Novel ED-XRD Technology

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MULTEX

MULTEX calculates the ODF from XRD pole figures using the component method introduced by Kurt Helming. The strength of this method is the reduction of the ODF to a very limited number of very meaningfull parameters. These parameters model texture components like fiber textures or preferred orientations in the Euler orientation space. The method allows to describe sharp and weak textures.

For more details please refer to www.texture.de.

 
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