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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
X-ray Microanalysis and EBSD – Products by Bruker Nano
Bruker Nano is Bruker's business unit for instrumentation for the analysis at highest spatial resolution. On these pages you will find information on
QUANTAX EDS for SEM and S/TEM
Bruker's unique QUANTAX systems with the XFlash® 6 detector series for X-ray micro- and nano-analysis (EDS) on scanning electron microscopes (SEM) and (scanning) transmission electron microscopes (S/TEM) are leading in performance for all tasks in elemental analysis.
QUANTAX Electron Backscatter Diffraction (EBSD)
The QUANTAX CrystAlign EBSD system is fully integrated with the QUANTAX EDS system under a single user interface and therefore comfortable and easy to use. The e-Flash1000 EBSD detector is extremely fast and at the same time offers great flexibilty in measurement setup through the in-situ tilt option, including simultaneous EDS and EBSD measurement.
More Information
You are also welcome to use our general information request form to obtain additional information.
