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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - PITTCON 2012
Mar 11-15, Orlando, Florida, USA - APEX2 Workshop – Twinning and Disordered Samples
Mar 20-22, Taipei, Taiwan - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
X-ray Microanalysis and EBSD – Products by Bruker Nano
Bruker Nano is Bruker AXS' newly formed business unit for instrumentation for the analysis at highest spatial resolution. On these pages you will find information on
QUANTAX EDS for SEM and S/TEM
Bruker's unique QUANTAX systems for X-ray microanalysis (EDS) on scanning electron microscopes (SEM) and (scanning) transmission electron microscopes (S/TEM) are leading in performance for all tasks in elemental analysis.
QUANTAX Electron Backscatter Diffraction (EBSD)
The QUANTAX CrystAlign EBSD system is fully integrated with the QUANTAX EDS system under a single user interface and therefore comfortable and easy to use. The e-Flash1000 EBSD detector is extremely fast and at the same time offers great flexibilty in measurement setup through the in-situ tilt option, including simultaneous EDS and EBSD measurement.
More Information
You are also welcome to use our general information request form to obtain additional information.
