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M1 MISTRAL – Tabletop µ-XRF Spectrometer for Jewelry and Layer Analysis
- M1 MISTRAL
The M1 MISTRAL is a compact spectrometer for the analysis of jewelry alloys. Even large samples of dimensions up to 100 x 100 x 100 mm can be analyzed directly and non-destructively. Preparation is not required. As the whole measurement setup is in ambient air, elements from Z=22 (titanium) upwards can be analyzed.
Replace fire assays for jewelry analysis with a fast, reliable, non-destructive and convenient method
Use the M1 MISTRAL to analyze pieces of jewelry, coins or precious metals in general. You can place the even most intricate or complicatedly shaped samples on the sample stage. The built-in video microscope with cross-hair function allows you to pinpoint the location for analysis without effort. The actual measurement procedure takes only a fraction of a minute and is performed with a few mouse-clicks only under control of the attached PC. The easy-to-use analysis software suite facilitates output of measurement results in either wt.% or karat.
The M1 MISTRAL is suitable for the analysis of the following alloys (among others)
- Yellow gold
- White gold
- Pt-alloys
- Ag-alloys
Accuracy of analyses is in the range of 0.2 wt.%
Analysis of metallic layers with high spatial resolution
The X-ray source of the M1 MISTRAL is collimated to a spot size of 0.3 or 0.5 mm (depending on factory setting). This warrants that only the region of interest is examined and not the surrounding area as well. The high spatial resolution is ideal for the analysis of metallic thin layers - or layer systems - on all kinds of substrates, including metals, plastics and PCBs. M1 MISTRAL's powerful software tools do not only allow you to determine layer composition but also thickness.
A selection of layer systems that can be analyzed:
- Zn-Fe
- Au-Ni-Cu
- Au-Pd-Ni-Cu
- CuSn-Ni-Cu
The accuracy that can be attained is better than 0.01 wt.%.
