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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
ESPRIT LineScan
- Quantitative line scan
The ESPRIT software suite offers both qualitative and quantitative line scan options
ESPRIT Line
Ultra-fast line scan with spectra data base
- line profiling for any number of elements or ROIs (energy ranges)
- arbitrary selection of scan line position, length, and angle using preview image
- high resolution, high speed scan (> 105 points/s)
- multiple scans with data accumulation for reduction of sample stress
- manual start and stop or preselected acquisition time
- spectral database containing all sample points, can be stored to disk an reprocessed at any time
- selection of elements prior, during, or after line scan acquisition
- filter and display options for result presentation and graphical export
ESPRIT QLine
Quantitative evaluation of line scan spectra data base
- standardless quantitative analysis for all sample points including deconvolution and matrix correction
- automatic element identification and predefined or interactively optimized evaluation strategies
- spectral data base for all sample points can bes stored to disk and reprocessed at any time
- versatile result formatting
- filter and display options for result presentation and graphic export
- ASCII- and EXCEL-format export of line profile data
