X-ray Diffraction

LEPTOS S

LEPTOS S
Residual stress gradients can be calculated from multiple {hkl} measured at different grazing-incident angles. The absorption and refraction of X-rays, as well as the coating thickness, are taken into account for the calculation.

LEPTOS S is an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin2ψ and extended XRD2 methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.

Theory

  • Classic and extended sin2ψ, as well as XRD2 methods
  • Evaluation of residual stresses from multiple {hkl}
  • Stress/strain gradients in thin polycrystalline coatings

Data evaluation

  • Five methods for finding a peak position: Gravity, Sliding Gravity, Parabolic, Pseudo-Voigt and Pearson VII
  • Comprehensive data correction capabilities: absorption, background subtraction, polarisation correction, smoothing and Kα2-separation
  • User-extendable material database including elastic properties of materials and X-ray Elastic Constants (XEC)
  • Calculation of the stress tensor in the sample and principal coordinates for normal, normal & shear, biaxial, biaxial & shear, and triaxial stress models
  • Comparison of XRD2 and sin2ψ methods by using an integration tool
  • • Area mapping; automated data evaluation via script interface

Output

  • Display of the εφψ (sin2ψ), dφψ (sin2ψ) and 2φψ (sin2ψ) regressions
  • Angular orientation matrix between main and sample’s coordinate systems
  • Ellipsoid Lame view
  • Saving of results in XML-based project files
  • Several reporting options and customizable export

More Information

LEPTOS