LEPTOS S

: Residual stress gradients can be calculated from multiple {hkl} measured at different grazing-incident angles. The absorption and refraction of X-rays, as well as the coating thickness, are taken into account for the calculation.

LEPTOS S is an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin²ψ and extended XRD² methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.

Theory

Classic and extended sin²ψ, as well as XRD² methods
Evaluation of residual stresses from multiple {hkl}
Stress/strain gradients in thin polycrystalline coatings

Data evaluation

Five methods for finding a peak position: Gravity, Sliding Gravity, Parabolic, Pseudo-Voigt and Pearson VII
Comprehensive data correction capabilities: absorption, background subtraction, polarisation correction, smoothing and Kα2-separation
User-extendable material database including elastic properties of materials and X-ray Elastic Constants (XEC)
Calculation of the stress tensor in the sample and principal coordinates for normal, normal & shear, biaxial, biaxial & shear, and triaxial stress models
Comparison of XRD2 and sin2ψ methods by using an integration tool
• Area mapping; automated data evaluation via script interface

Output

Display of the εφψ (sin2ψ), dφψ (sin2ψ) and 2φψ (sin2ψ) regressions
Angular orientation matrix between main and sample’s coordinate systems
Ellipsoid Lame view
Saving of results in XML-based project files
Several reporting options and customizable export

More Information

LEPTOS