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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
LEPTOS R
- With LEPTOS R diffuse scattering rods and rocking curves can be fitted both as a separate curve and as a consistent set of several curves in any combination of transverse and longitudinal scans.
LEPTOS R is designed for the analysis of X-ray Reflectivity (XRR) data and off-specular Diffuse Scattering (DS) from thin layered structures. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the R module inherits all the functionality common for the whole package.
LEPTOS R has been highly rated in several international benchmarks, including the VAMAS project A10. The structure of LEPTOS R is compliant with the newly developed international rfCIF standard for the data format of XRR data.
Theory
- Dynamical Parratt’s formalism to calculate reflectivity from multilayered samples and distorted-wave Born approximation for simulation/fitting of the off-specular diffuse X-ray scattering
- Diversity of interfacial roughness models for samples with different growth morphology
- Operator Method for the universal calculation of X-ray scattering parameters from crystalline and amorphous materials, such as: atomic scattering factors, X-ray polarizabilities, etc.
- Patented Method of EigenWaves (MEW) for the essential acceleration of the fits for the superlattices and repeating multilayers
Sample editor
- Powerful and flexible sample model editor including the tools for superlattices, linking of layer physical parameters, user-defined layer profiles
- Extensive, user extendable materials database
- Virtual Diffractometer tool to account for the instrumental resolution function and footprint effects
Data evaluation
- Simulation and fitting of the off-specular diffuse X-ray scattering by several vertical and lateral roughness correlation models; both specular and off-specular data can be fitted consistently
- Simulation, estimation and fitting of data in direct and reciprocal space
- Fast Fourier Transform for a quick estimation of the layer thicknesses
- Detailed analysis through fitting using Genetic Algorithm, Simulated Annealing, Simplex or Levenberg-Marquardt fitting routines.
- Area mapping; automated data evaluation via script interface
Output
- Saving of results in XML-based project files
- Several reporting options and customizable export
