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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
LEPTOS H
- LEPTOS H contains an Area Mapping module that makes it possible to treat HR-XRD data taken point-by-point over a large sample area and to display mappings of sample parameters.
LEPTOS H stands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.
Theory
- Fast 2x2 and precise 4x4 Recursive Matrix Formalism to overcome the limitations of the Takagi-Taupin approach
- Operator Method for the universal calculation of X-ray scattering parameters from crystalline materials, such as: atomic scattering factors, X-ray polarizabilities, etc.
- Patented Method of EigenWaves (MEW) for the essential acceleration of the fits for the superlattices and repeating multilayers
Sample editor
- Powerful and flexible sample model editor including tools for superlattices, linking of layer physical parameters, user-defined layer profiles
- Extensive, user extendable materials database
- Cell Builder engine for automatic adjustment of the sample crystallographic properties: lattice strain and mismatches, relaxation degree, elemental concentrations and mass density
- Virtual Diffractometer tool to account for the instrumental resolution function and footprint effects
Data evaluation
- Simulation, estimation and fitting of data in direct and reciprocal spaces
- Simultaneous evaluation of several Bragg reflections measured from one sample
- Fast Fourier Transform for a quick estimation of the layer thickness and the Estimate tool for the fast evaluation of sample parameters from peak postions, directly from measured data
- Precise fitting of numerous sample parameters using the advanced dynamical theory. Available fitting routines: Genetic Algorithm, Simulated Annealing, Simplex or Levenberg-Marquardt
- Consideration of the nonpolar orientations of the crystallographic unit cell and various {hkl} reflections in a single sample
- • Area mapping; automated data evaluation via script interface
Output
- Saving of results in XML-based project files
- Several reporting options and customizable export
