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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Lateral Force Microscopy (LFM)
- Topographic image, size is 5 x 5 µm2, Z-range is 26 nm
- Lateral Force (LFM) image, same location as in topo image
Lateral Force Microscopy (LFM) allows to image the variation of the friction properties of a surface.
In contact mode the scanner is oscillated in the direction along the axis of the cantilever with a frequency higher than the scanning frequency. The sticking or sliding behavior of the tip on the surface modulates the cantilever deflection. This modulation is detected via Lock-in technique.
LFM delivers qualitative friction contrast
LFM delivers qualitative friction contrast, especially on samples with smooth topography, but nonuniform mechanical properties, like polymer blends, metal alloys or Langmuir-Blodgett films.
AFM measurement on a Langmuir-Blodgett film, the sample is a one layer thin film made of a mixture of behenic acid (BA) and diphenyl bis (octadecylamino)phosphonium bromide (DPOP).
Both images were acquired at the same time.
