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- Application Note SC-XRD 392 - Thaumatin S-SAD
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
LAB Tools
Various X-ray methods are available for obtaining crucial parameters in the nanodomain. One can think of thickness, density, roughness, chemical composition and orientation of thin layers, lattice constants and mismatches, strain and relaxation of epitaxial films and porosity and crystallite sizes in thin films.
The D8 DISCOVER offers optimized solutions for the analysis of the smallest features using X-ray reflectivity (XRR), high resolution X-ray diffraction (HRXRD), micro diffraction (µXRD), grazing incidence diffraction (GID), grazing incidence small angle X-ray scattering (GISAXS) and micro X-ray fluorescence (µXRF).


