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Product News

  • Bruker AXS Announces New G4 PHOENIX Combustion Analysis System with Infrared Furnace for Determination of Diffusible Hydrogen in Wide Range of Metals Applications
  • Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008
  • Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH

Upcoming Events

  • Visit us at Arablab, hall 7, booth 381-5, Jan 10 - 13 2009
  • TXRF Webinar: "Trace Element Analysis: Time and Cost Savings with TXRF" Jan 21 2009

Welcome to Bruker Nano

For more than 10 years we have been developing atomic force and scanning probe microscopes (AFM / SPM) for the nanotechnology market.

Based on our extensive experience we provide complete solutions for highest resolution surface inspection.

 

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