Introduction

X-ray microanalysis is an analytical technique for determination of the chemical composition of solid samples, thin layers or particles in electron microscopes. Using our QUANTAX energy dispersive X-ray spectrometry system (EDS) it is possible to detect and analyze all elements from beryllium (boron) to americium simultaneously. Obtaining elemental information from a sample volume of only a few microns and providing relative detection limits in the order of a tenth of mass percent makes X-ray microanalysis one of the most sensitive analysis methods available.

The QUANTAX family of EDS systems offered by Bruker AXS Microanalysis delivers reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use.

Our unique, liquid nitrogen free XFlash® silicon drift detectors (SDD) together with the state-of-the-art hybrid pulse processor technology deliver both the highest possible energy resolution and over ten times the speed of conventional Si(Li) based systems.

QUANTAX also features our powerful, new ESPRIT software with intuitive and easy-to-use interface. With true standardless analysis, proven standards based quantification, or even a combination of both methods, ESPRIT offers optimal tools for any application.

Please visit our information request page, if you would like a poster on X-ray microanalysis.