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- Bruker AXS Announces New G4 PHOENIX Combustion Analysis System with Infrared Furnace for Determination of Diffusible Hydrogen in Wide Range of Metals Applications
- Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008
- Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH
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Introduction to X-ray Metrology
- X-ray Metrology with the D8 FABLINE
X-ray Metrology with the D8 FABLINE offers X-ray solutions for front and back end of line processes:
- Wafers from 6“ to 300 mm
- Horizontal sample mount for safe wafer handling and high sample throughput
- SECS/GEM interface for straightforward fab integration
- Automatic pattern recognition for precise micro analysis
- Integrated single or dual FOUP port interface for wafer loading
- Touch screen for easy operation