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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Innova-IRIS-inVia
Best TERS-Enabled AFM-Raman System Integration Available
Innova enables TERS through its hardware integration. A key part of that is the unique Innova head design that is unparalleled in its physical and optical access. It not only implements the optimized off-axis Raman geometry for maximum sensitivity but also permits multiple simultaneous video views. With the ability to view the AFM tip and sample top-down and simultaneously also view it through the Raman optics, the integration enables the key step, i.e., alignment of the Raman optics to the tip for TERS.
The integration retains the ability to use the systems individually without compromise in performance or feature set. A full TERS-enabled Innova-IRIS inVia system can be created from either a standard Bruker Innova or a standard Renishaw inVia through a simple upgrade path.
Innova enables TERS through its software integration. Its IRIS software includes simplified approach curves to verifying Raman signal enhancement during TERS setup, as well as handshaking communication and data transfer for automated TERS mapping. The combined system offers full use of complete analysis packages for all AFM and Raman data generated. It includes the industry leading NanoScope Analysis software for AFM processing and analysis as well as the WiRE Raman data analysis software.
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