Innova-IRIS

The Innova-IRIS system enables the seamless blend of atomic force microscopy and Raman spectroscopy by combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with the most advanced atomic force microscopy characterization. To create a TERS-enabled AFM-Raman spectroscopy system for opaque samples, combine the Innova-IRIS with your choice of a leading Raman system. However you tailor your system, your application will benefit from the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers

Unmatched Ease-Of-Use For Spectroscopy In Nanostructured Materials

• Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
• Experiment selector distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS (tip-enhanced Raman spectroscopy) setups

Highest Performance, Most Complete AFM Capabilities In The World

• Fully featured suite of advanced electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
• System design for noise and drift elimination enables high resolution imaging and long Raman integration times

True Nanoscale Spectroscopy Targeted To Your Application

• Modular accessories tailor system to targeted applications, ensuring most complete solution
• Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples

Request More Information

Request more information, schedule a demonstration, and join our Atomic Force Microscopy Email List to get updates on everything nano

Documents

Innova Scanning Probe Microscope (Brochure, PDF)

Advances in Combined Atomic Force Microscopy and Raman Spectroscopy (Application Note, PDF)

Innova-IRIS TERS-Enabled AFM System (Datasheet, PDF)

Videos

Co-Localized AFM and Raman Applications — Introducing AFM and Raman users to the respective techniques, AFM-Raman configurations, and TERS (tip-enhanced Raman scattering)

YouTube Channel — Subscribe to our channel to get access to all of our videos, submit feedback or comments on any video, and favorite videos you enjoy

Publications

Pushing Raman to the Nanoscale (Oct. 2011 – Chemical & Engineering News)

Modes & Techniques

Conductive AFM Mode Contact Mode Electrostatic Force Microscopy Force-Distance Measurements Force Modulation Microscopy Magnetic Force Microscopy

PhaseImaging™ Scanning Capacitance Microscopy Scanning Thermal Microscopy Scanning Tunneling Microscopy Surface Potential Mode TappingMode