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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Innova-IRIS
Request More Information
Use the request form below to contact us regarding the co-located AFM-Raman, TERS-enabled Innova-IRIS microscope for opaque samples. Also, you may request to arrange a personal demonstration of the integrated AFM-Raman solution using your samples. Finally, be sure to sign up for our Atomic Force Microscopy Email List to stay current on every AFM-Raman advancement from Bruker and keep informed about all of our learning resources, events, and opportunities.
Contact The Nano Surfaces Division, AFM Business, Bruker Corporation
Need to speak with a person? Find an AFM Business office nearest you? Or do you need a mailing address for our offices? Please use our contact information here.
