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- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Announces New Website and Online Store for AFM Probes
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Inline Imaging Modules For Tribology
Enhanced Tribological & Mechanical Testing Without Sample Removal
The optional tribological inline imaging modules include an integrated atomic force microscope (AFM), 3D stylus profilometer, and medium- or high-magnification microscopes. The sample images are generated automatically after the test (indentation, scratch, wear, etc.) without removing the sample from the tool.
Request more information about the inline imaging modules for tribology
Available Inline Imaging Modules
- 3D Stylus Profiler Inline Imaging Module — Generate 3D stylus profilometer images without any sample removal
- Atomic Force Microscope Inline Imaging Module — Perform nano-imaging, nano-measurements, and nano-mapping without any sample removal
- High-Magnification Microscope Inline Imaging Module — With revolving head and multiple objectives
- Medium-Magnification Microscope Inline Imaging Module — For in situ imaging and precise positioning
