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Inline Imaging Modules For Tribology

Enhanced Tribological & Mechanical Testing Without Sample Removal

The optional tribological inline imaging modules include an integrated atomic force microscope (AFM), 3D stylus profilometer, and medium- or high-magnification microscopes. The sample images are generated automatically after the test (indentation, scratch, wear, etc.) without removing the sample from the tool.

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Available Inline Imaging Modules

  • 3D Stylus Profiler Inline Imaging Module — Generate 3D stylus profilometer images without any sample removal
  • Atomic Force Microscope Inline Imaging Module — Perform nano-imaging, nano-measurements, and nano-mapping without any sample removal
  • High-Magnification Microscope Inline Imaging Module — With revolving head and multiple objectives
  • Medium-Magnification Microscope Inline Imaging Module — For in situ imaging and precise positioning