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- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Announces New Website and Online Store for AFM Probes
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Inline Imaging Modules For Tribology
Enhanced Tribological & Mechanical Testing Without Sample Removal
The optional tribological inline imaging modules include an integrated atomic force microscope (AFM), 3D stylus profilometer, and medium- or high-magnification microscopes. The sample images are generated automatically after the test (indentation, scratch, wear, etc.) without removing the sample from the tool.
Request more information about the inline imaging modules for tribology
Available Inline Imaging Modules
- 3D Stylus Profiler Inline Imaging Module — Generate 3D stylus profilometer images without any sample removal
- Atomic Force Microscope Inline Imaging Module — Perform nano-imaging, nano-measurements, and nano-mapping without any sample removal
- High-Magnification Microscope Inline Imaging Module — With revolving head and multiple objectives
- Medium-Magnification Microscope Inline Imaging Module — For in situ imaging and precise positioning

