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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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Minerals, Mining and Geology
X-ray analysis of polycrystalline powder samples is one of the most powerful process-control tool for the minerals and mining industry. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. More recently the capabilities of X-ray diffraction (XRD) are discovered for analysing the quantitative crystalline phase composition.
X-ray Fluorescence (WDXRF, EDXRF) for Elemental Analysis in Minerals, Mining and Geology
- S4 PIONEER
Wavelength dispersive X-ray fluorescence analysis (WDXRF) is the most accepted analytical technique for elemental analysis to ensure the highest product quality and to control the mining process or for geological surveys. Unrivalled accuracy and precision for elements in concentration ranges from 100% down to the trace level, the simple and fast sample preparation for solid samples as well as the high grade of flexibility and integration to any kind of process are making WDXRF the most preferred method in industry and research.
The wavelength dispersive X-ray fluorescence spectrometer (WDXRF) S4 PIONEER provides outstanding high analytical performance for most demanding analytical tasks regarding accuracy, precision, speed and reliability in industrial environment and in research.
The S4 PIONEER is the only wavelength dispersive X-ray fluorescence spectrometer (WDXRF) keeping installation requirements and running costs low due to the unique “Plug ‘n Analyze” technology, and providing high analytical performance and flexibility.
For dedicated analytical task, monitoring and filed work in geology and exploration the S2 RANGER, the unique benchtop energy dispersive X-ray fluorescence spectrometer (EDXRF) with intuitive touch screen operation, is the right choice to serve all needs for mobility, flexibility and ease of use in combination with best performance.
Qualitative and Quantitative X-ray diffraction
- D4 ENDEAVOR
X-ray diffraction (XRD) is an established non-destructive tool for qualitative and quantitative phase analysis. Recent software and hardware developments, particularly in detector technology, have given XRD a more widespread appeal in all fields of earth and material sciences as well as in the industrial world.
In addition to qualitative phase analysis, complete quantitative phase analysis presently offers a level of accuracy and precision that was not possible just a couple of years ago. Due to the introduction of our TOPAS software, X-ray diffraction (XRD) combined with Rietveld refinement has evolved into the most powerful method available for quantitative crystalline phase analysis. TOPAS is offering unrivalled performance and simplicity for quantitative Rietveld analysis. After having revolutionised cement production, TOPAS is currently opening up new possibilities in the field of Minerals and Mining.
Our flexible diffraction solutions cover user needs from research facilities to fully automated industrial laboratories. Our diffractometers are of a modular design, enabling easy interchanges of optics, sample environments and detectors. With the largest available variety of different components, we have the optimum configuration for your application. Expert application, sales, training and service is in place to support the customer.