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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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Ceramics and Refractories
High grade ceramic materials are crucial for every high-temperature industrial production process far above 1200 °C such as metal production (Steel, Copper and Aluminium), Cement, Glass, energy generation and thermal waste treatment. They are used where metals have reached their limits of their suitability and components are exposed to thermal, mechanical or chemical stress. For the protection of kilns, vessels, pipelines and machinery the surfaces are lined with refractories specific for every kind of process. All production accessories have to withstand the high temperature, high product quality for high performance ceramics and refractories is one of the keys for long process uptimes.
Wavelength-dispersive X-ray fluorescence for highest quality (WDXRF)
- S4 PIONEER
X-ray-fluorescence analysis (XRF) is ideal for the routine quality control as well as for all analytical tasks in research, because it is safe, the sample preparation is easy - solids require just a little sample preparation - and the X-ray fluorescence spectrometer (XRF) can be automated and integrated in the production process.
Only wavelength dispersive X-ray fluorescence (WDXRF) can reach the high demands of accuracy and precision to guarantee highest product quality, characterising the elemental composition of the ceramics and refractories. The S4 PIONEER, our high performance, high throughput wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is the perfectly suited tool to analyze major and minor compounds and to specify impurities and traces, in raw materials as well as in the final product.
The S8 TIGER 1K, the “Plug ‘n Analyze” wavelength dispersive spectrometer (WDXRF) fits everywhere in the process, where installation requirements are critical. Ensuring high analytical performance due to the optimized beam path the S8 TIGER 1K can be operated without detector gas or cooling water supply due to the unique “Plug ‘n Analyze” technology of the sealed PRO-4 with high transmission window and the optimized X-ray tube.
Qualitative and Quantitative X-ray diffraction
- D4 ENDEAVOR
X-ray diffraction (XRD) is an established non-destructive tool for qualitative and quantitative phase analysis. Recent software and hardware developments, particularly in detector technology, have given XRD a more widespread appeal in the world of ceramics and refractories.
In addition to qualitative phase analysis, complete quantitative phase analysis presently offers a level of accuracy and precision that was not possible just a couple of years ago. Due to the introduction of our TOPAS software, X-ray diffraction (XRD) combined with Rietveld refinement has evolved into the most powerful method available for quantitative crystalline phase analysis. TOPAS is offering unrivalled performance and simplicity for quantitative Rietveld analysis. After having revolutionised cement production, TOPAS is currently opening up new possibilities in all fields of ceramics and refractories.
Our flexible diffraction solutions cover user needs from research facilities to fully automated industrial laboratories. Our diffractometers are of a modular design, enabling easy interchanges of optics, sample environments and detectors. With the largest available variety of different components, we have the optimum configuration for your application. Expert application, sales, training and service is in place to support the customer.