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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
ESPRIT Imaging
ESPRIT provides a range of imaging options, from simple image acquisition to a fully featured image analysis package.
ESPRIT Scan
- Image acquisition mode with scan preview window
Image acquisition software for an external scan system
- external electron beam control, mode switching, and image acquisition for SEM, STEM, and EPMA
- drivers for IO-Scan and SEMLink
- high quality, high resolution digital images from selectable analog signal sources (SE, BSE, ...)
- fast preview mode for scan area selection and beam adjustment
- independent selection of acquisition time, image resolution, and scan modes
- pixel, line and frame averaging including power line synchronization (option)
- automatic and manual brightness, contrast, and gamma correction
- display of histogram
- µ-marker and image legend selection
ESPRIT ColorScan
Acquisition of X-ray enhanced color images
- immediate color images without element preselection or presetting of X-ray ranges
- intuitive discrimination of phases by different colors and shades in high resolution electron images
- powerful combination of topological and chemical contrast
- easy searching for points and regions of interest
- highlighting of particles, artefacts, or unique regions on sample surface
- search for homogeneous regions for exact analysis results
- progressive scan with improving image quality
- optimally suited for high-speed XFlash®systems
ESPRIT Vision
- Processed and labeled image
Digital image processing
- choice of configurable image filters including binarization and inversion
- brightness, contrast and gamma-correction
- false color display
- b/w and color image processing
- overlay image for markers, legends and free graphical overlays
- interactive length, area, and angle measurements with data presentation in graphical overlays
- multi-stage image processing including internal image storage and multiple “undo” functionality
- image import and export in all common graphic formats
- twain export and windows clipboard supported
ESPRIT DriftCorr
- compensates the image shift of the scanned specimen area by comparing the current image with the image acquired when starting the measurement
- automatically corrects the external scan generator during acquisition
- shows the current and the maximum shift value as well as the quality of the comparison process
- stops the measurement when the maximum correction value is exceeded
- works in combination with image acquisition functions and the options MultiPoint, Objects, LineScan, Mapping and HyperMap
