Language

High-Brightness LED Manufacturing & Light-Emitting Diode Wafer Inspection

HB-LED Metrology Improves All Aspects Of Our Lives

The High-Brightness Light Emitting Diode (HB-LED) industry is continuing to experience rapid year-on-year growth. The primary drivers for LED adoption include applications in backlighting of LCD TVs and computer displays, automotive lighting, mobile phone and other hand-held device displays, and as a more efficient solution for general residential and commercial lighting. To achieve performance goals for efficiency and wavelength stability, HB-LED manufacturers employ specialized structures to optimize output. The measurement of these features is difficult to obtain due to their steep slopes and small sizes. Optical interferometric profilometry has a proven ability to measure and monitor HB-LED wafer surfaces rapidly and repeatably in three-dimensional (3D) detail, enabling an increase in production efficiency and quality. Specialized optics can be used with white light interferometers to dramatically improve the signal strength, and additional processing allows for gauge-capable, high-throughput results in production environments. These systems provide long-term 3-sigma standard deviations of less than 10 nanometers on the critical parameters of height, pitch, and width. This will eventually result in higher quality and less expensive HB-LEDs in all aspects of our lives.

3D Optical Microscopes, Atomic Force Microscope, and Stylus Profiler High-Brightness LED Solutions

Bruker's 3D optical microscopes, atomic force microscope, and stylus profiler solutions for high-brightness LED wafer manufacturers allow extreme flexibility to support R&D and process development, as well as the speed and repeatability needed for today's demanding quality control.

• ContourGT-X8 3D Optical Microscope

• ContourGT-X8 PSS 3D Optical Microscope

• ContourGT-X3 3D Optical Microscope

• ContourGT-K1 3D Optical Microscope

• ContourGT-K0 3D Optical Microscope

• DektakXT Stylus Profiler

• Dimension Edge PSS AFM with AutoMET Software

• SP9900 Large-Format Surface Profiling System

ContourGT-X8 PSS Brochure

The ContourGT-X8 PSS Non-Contact, Optical Profiler and 3D Microscope provides high-throughput and precision surface metrology for HB-LED Patterned Sapphire Substrate production environments. Read our free PDF brochure to learn more.

• ContourGT-X8 PSS 3D Microscope (5.2 MB)

LEDs Magazine Article - Precision Tools Support Critical PSS Metrology From R&D Through High-Volume LED Fabrication

This article, published in the September 2011 issue of LEDs Magazine, presents how the different capabilities of the atomic force microscope and the 3D optical microscope are well-suited to the demands of high-brightness LEDs built on patterned sapphire substrates.

• Read the article now

Webinar - Combining Technologies For HB-LED Applications

Atomic force microscopy (AFM), 3D optical microscopy, and stylus profilometry provide highly complementary measurement capabilities required for adequate design & process control needs that are being driven harder than ever by the worldwide advances in high-brightness LED manufacturing. This exclusive webinar demonstrated how these surface measurement systems combine to meet critical requirements in a highly cost-effective manner.

• Download the PDF copy of the presentation slides