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- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

High-Brightness LED Manufacturing & Light-Emitting Diode Wafer Inspection
Request More Information
Use the request form below to contact us regarding High-Brightness LED (HB-LED) manufacturing, Light-Emitting Diode Wafer Inspection, and other HB-LED applications using our 3D microscopes and SP9900 Large-Format Surface Profiling System. Also, request to arrange a demonstration of any of our metrology systems using your Light-Emitting Diode Wafer or HB-LED samples. Finally, be sure to sign up for our Profiler Email List to stay current on every optical, stylus, and surface metrology topic concerning High-Brightness LED applications.
Request More Information Here
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Need to speak with a person? Find an email for an office nearest you? Or do you need a mailing address for our Tucson offices? Please use our contact information here.

