Because of its unique flexibility, the Tracer series of XRF analyzers has become the defacto standard for art and archaeometry investigations. It is also a perfect choice for research and teaching applications. In addition to the standard calibration and analysis capabilities expected from a handheld XRF system, this system is unique in its flexibility for the investigation of non-uniform substances and for training students in the field of XRF. The system comes standard with the software necessary to control the excitation parameters and perform empirical calibrations.  You can easily use this system in the laboratory, controlled by your choice of either a PC or PDA. Or if you need to take the analyzer to the field, install the battery and use it as a handheld instrument with the PDA interface.

Investigation of non-uniform materials such as historic or non-homogeneous objects typically requires more than a point-and-shoot type of analyzer with only pre-defined calibrations. The Tracer III-SD’s unique flexibility to control all of the excitation parameters allows you to decide the best settings for your material under test. Remember, the results are a function of many factors such as: sample density, X-ray energy, and homogeneity of the sample. The Tracer III-SD also allows the manual insertion of any filter necessary to adjust the excitation. PC based software allows control of the X-ray tube’s current and voltage. In addition, the Tracer III-SD is based on Silicon Drift Detector (SDD) technology which provides the ultimate sensitivity and speed of detection.