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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
GSR Professional - Automated Gunshot Residue Analysis
Bruker's GSR Professional is an automatic gunshot residue analysis package that combines ease-of-use with full control over results. Set up in minutes, using a four-step wizard, it provides complete information in a short time. Analytical results can be efficiently checked using the review function to either revisit single particles or rerun whole analyses with different parameter sets.
4-step wizard for speed and convenience
GSR-Professional's unique wizard permits easy setup and performance of the analysis of up to 20 samples using individual search conditions.
- Initial setup: Load configurations and identify sample
- Definition of search conditions: Select search area, minimum particle size, particle classification (and more)
- Search setup summary: Review settings and return to previous steps for changes, if necessary
- Run measurement: Apart from allowing the user to pause or stop a measurement, this dialog provides information on measurement progress and data.
Other selected highlights
- Flexible sample holder configuration
- EDS detector setup
- Automatic calibration of beam current, EBSD detector, EDS and microscope magnification
- Simple revisiting and validation, stage can be driven directly to a particle which can then be reanalyzed
- Manual or automatic reclassification
- Comprehensive reporting


