Frontiers in X-ray Materials Analysis

You are cordially invited to discover the latest advancements in nanotechnology applications of high-resolution X-ray diffractometry at Bruker's complementary and exclusive Frontiers in X-ray Materials Analysis (FXMA) seminar.

Join us on Thursday, June 7th at the Fremont Marriott Silicon Valley to gain new insights into materials research, wafer inspection, thin film analysis, and production quality control of semiconductor samples. You'll learn how to pinpoint properties like thickness, composition, lattice structure, orientation, stress and texture like a pro!

Seminar Topics:

  • High resolution X-ray reflectometry
  • Thin films and nanostructures
  • High-throughput XRD screening
  • Recipricol space mapping
  • Structure solution
  • Phase identification and quantification
  • Small angle X-ray scattering

Experts from industry and academia will share first hand their application knowledge and latest technological advances and methods in this interactive and educational event.

This seminar will be offered both onsite and online, seats are limited so register today!  Please RSVP by Friday, May 25th.

If you have questions or need hotel accommodations, please contact Bruker Events.

We look forward to being your hosts in San Francisco and online.