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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
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- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Force Modulation Microscopy (FMM)
- Etched steel surface, topography, image size is 390 x 390 nm2, Z-Range is 40 nm
- FMM channel
Force Modulation Microscopy (FMM) displays information about the elastic properties of a sample.
During the measurement in contact or in the dynamic mode the tip-sample distance is modulated, at a frequency high enough that the topography feedback can not follow this modulation. In the dynamic mode this causes an amplitude modulation of the cantilever oscillation. In contact mode the deflection of the cantilever changes periodically with the modulation frequency.
Analyzing the interferometer signal
Analyzing the interferometer signal at the modulation frequency reveals information about the elastic properties. This method is useful for materials with nonuniform mechanical properties, like polymer blends and metal alloys.
