An Overview of XRF Basics
Table of Contents
1. Fundamental Principles
- 1.1 Electromagnetic Radiation, Quanta
- 1.2 Nomenclature
- 1.3 Generating the Characteristic Radiation
- 1.4 Excitation of Characteristic Radiation in Sample Material
- 1.5 Tube-spectrum Scattering at the Sample Material
- 1.6 X-ray Detectorss
- 1.7 Pulse Height Analysis (PHA)
- 1.8 Diffraction in Crystals
2. Instrumentation
- 2.1 Multichannel Spectrometers
- 2.2 Sequential Spectrometers
- 2.3 Incident Beam Components
- 2.4 Emitted Beam Components
- 2.4.1 The Vacuum Seal
- 2.4.2 Collimator Masks
- 2.4.3 Collimators, the Soller Slit
- 2.4.4 The Crystal Changer
- 2.4.5 The Flow Counter
- 2.4.6 The Sealed Proportional Counter
- 2.4.7 The Scintillation Counter
- 2.5 Electronic Pulse Processing
3. Sample Preparation Techniques for XRF Analysis
- 3.1 Introduction
- 3.2 Preparation of Solid Samples
- 3.3 Preparation of Liquid Samples
- 3.4 Preparation of Filter Samples