BRUKER-AXS - INTRODUCTION TO X-RAY FLUORESCENCE (XRF)

An Overview of XRF Basics

A	absorption absorption edge Angström (Å) anode anode material atomic number atomic shell Auger effect
B	back-scattering electrons binding energy Bohr's atomic model Bragg's equation Bremsspektrum
C	cathode characteristic radiation of the elements in the sample material collimator masks Collimators Compton scattering counter plateau crystal changer crystal types cup aperture curved crystals
D	dead time correction detectors diffraction discriminator Dispersion
E	electromagnetic radiation electron shells electronic pulse processing end-window tube, (see also) energy levels energy shells exit window
F	flow counter fluorescence yield
G	gamma radiation generator, (see also)
H	high voltage
I	intensity interference
K	Kcps kiloelectronvolts keV
L	layer thickness LiF(200), LiF(220), LiF(420) line separation line-shift correction

M	main amplifier mass attenuation coefficient multichannel spectrometer scanner multichannel spectrometer MRS multilayer XS-55, XS-N, XS-C, XS-B multilayers
N	Nomenclature
O	output
P	photon primary beam filter proportional counter, sealed pulse height analysis (PHA) pulse height distribution pulse height spectrum
Q	quanta
R	radiation intensity Rayleigh scattering reflection of higher orders
S	Sample cups saturation thickness scintillation counter Secondary enhancement sequential spectrometers side-window tube sine amplifier Soller slit Sources of standard samples special crystals ADP Ge InSb LiF(420) TIAP XS-B XS-C XS-N standard samples sources standard types sub-levels Supplementary literature
T	tube current Tube types Tube-spectrum scattering at the sample material
V	vacuum seal
W	wavelengths
X	X-ray fluorescence spectrometer instrumentation X-ray generator X-ray quanta X-ray tube