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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
ESPRIT Feature
- Setting up the feature detection routine
The Feature module adds comprehensive image analysis functions to the ESPRIT microanalysis package. At the heart of this solution is the ability to detect, measure and analyze any form of feature, and provide its chemical classification using the high throughput capability of the XFlash® Detectors.
Method based approach
The configuration of particle detection and chemical classification can be stored to disk as a method. Therefore such a method for feature analysis can be set up once by the expert, and used over and over by the less experienced user.
Full integration
Full integration with the ESPRIT software package allows ESPRIT Feature to use all of the necessary functions of ESPRIT combined with the usability already familiar to the QUANTAX user.
Full automation
The integration also allows the feature analysis to be automated via ESPRIT‘s JobControl function. All settings and methods can be selected for a fully automated feature and chemical classification run.
