X-ray Diffraction

General data evaluation options – EVA

DIFFRAC.SUITE TM Software EVA
EVA Software

EVA provides a complete collection of the best algorithms for XRD data analysis with full access to all function parameters. Seeing is believing - thanks to a unique Real-Time-Preview of all evaluations for visual validation. Guaranteeing most reliable and accurate results. Reversing an action? No problem! EVA allows an unlimited number of undo's and redo's!

  • Phase identification and quantitative analysis
  • Peak search and creation of peak data, e.g. for phase identification
  • Manual and fully automatic background subtraction
  • Data smoothing (Savitzky-Golay method or Fourier filtering)
  • Kα2-stripping (Rachinger method)
  • Calculation of profile parameters, e.g. line position, integrated area and half width and more
  • Crystallite size determination (Scherrer method)
  • Addition, substraction, scaling, normalization and merging of scans
  • Unlimited number of undo / redo operations