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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
General data evaluation options – EVA
EVA provides a complete collection of the best algorithms for XRD data analysis with full access to all function parameters. Seeing is believing - thanks to a unique Real-Time-Preview of all evaluations for visual validation. Guaranteeing most reliable and accurate results. Reversing an action? No problem! EVA allows an unlimited number of undo's and redo's!
- Phase identification and quantitative analysis
- Peak search and creation of peak data, e.g. for phase identification
- Manual and fully automatic background subtraction
- Data smoothing (Savitzky-Golay method or Fourier filtering)
- Kα2-stripping (Rachinger method)
- Calculation of profile parameters, e.g. line position, integrated area and half width and more
- Crystallite size determination (Scherrer method)
- Addition, substraction, scaling, normalization and merging of scans
- Unlimited number of undo / redo operations


