X-ray Diffraction

DIFFRACplus EVA

EVA is a comprehensive and extremely versatile graphics program for easy, fast and convenient 2- and 3-dimensional data evaluation and presentation. A complete collection of the best algorithms for powder diffraction data is provided including a unique Real-Time-Preview of all evaluations using the "ghost"-function.

  • Peak search and creation of d/I-files
  • Background subtraction
  • Data smoothing (Savitzky-Golay method or Fourier filtering)
  • Ka2-stripping (Rachinger method)
  • 2q-offset and sample displacement corrections
  • Calculation of profile parameters such as line position, center of gravity, integrated area, half width and many more
  • Undo / redo
  • Addition, subtraction and merging of scans
  • 3-dimensional presentation (waterfall plots, iso-intensity plots, true 3D plots)
  • Free selection of axis scalings, labels, colors, fonts, and so on
  • Data exchange options to and from any other Windows application: copy and paste, Windows metafiles
  • Creation of high quality outputs for direct printing or importing into any other Windows application

In combination with the ICDD Powder Diffraction File (PDF2, PDF4) or with a user powder diffraction database further powerful options are available:

  • Display of PDF stick patterns
  • Display of all database information
  • Graphical semi-quantitative phase analysis
  • "Combined XRD-XRF": Validation and improvement of quantitative phase analyses using elemental analysis results. Direct access to SPECTRAplus XRF databases, formatted ASCII-files, and more.
  • Display of hkl-indices for patterns
  • Graphical adjustment of lattice parameters

Automatic data evaluation and automatic printing of graphics and numerical results enable a modern, completely integrated lab automation.

See also SEARCH, the search/match option of EVA for phase identification.

More Information

DIFFRACplus SEARCH

DIFFRACplus EVA (PDF spec sheet)