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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
DIFFRACplus EVA
EVA is a comprehensive and extremely versatile graphics program for easy, fast and convenient 2- and 3-dimensional data evaluation and presentation. A complete collection of the best algorithms for powder diffraction data is provided including a unique Real-Time-Preview of all evaluations using the "ghost"-function.
- Peak search and creation of d/I-files
- Background subtraction
- Data smoothing (Savitzky-Golay method or Fourier filtering)
- Ka2-stripping (Rachinger method)
- 2q-offset and sample displacement corrections
- Calculation of profile parameters such as line position, center of gravity, integrated area, half width and many more
- Undo / redo
- Addition, subtraction and merging of scans
- 3-dimensional presentation (waterfall plots, iso-intensity plots, true 3D plots)
- Free selection of axis scalings, labels, colors, fonts, and so on
- Data exchange options to and from any other Windows application: copy and paste, Windows metafiles
- Creation of high quality outputs for direct printing or importing into any other Windows application
In combination with the ICDD Powder Diffraction File (PDF2, PDF4) or with a user powder diffraction database further powerful options are available:
- Display of PDF stick patterns
- Display of all database information
- Graphical semi-quantitative phase analysis
- "Combined XRD-XRF": Validation and improvement of quantitative phase analyses using elemental analysis results. Direct access to SPECTRAplus XRF databases, formatted ASCII-files, and more.
- Display of hkl-indices for patterns
- Graphical adjustment of lattice parameters
Automatic data evaluation and automatic printing of graphics and numerical results enable a modern, completely integrated lab automation.
See also SEARCH, the search/match option of EVA for phase identification.
