Language
Search
News
- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
![]() |
ESPRIT Quant
This tool provides you with fully automatic element identification and standardless quantification. It supports continuous identification and
quantification preview during spectra acquisition
- auto-start and batch processing for complete spectra data bases
- various pre-defined spectra evaluation methods for typical analytical cases:
- standardless analysis for polished samples, rough surfaces and
particles (P/B-ZAF) - standardless analysis for thin layers (P/B-FILM)
- standardless analysis for light elements and low energy peaks (TQuant)
- standardless analysis for polished samples, rough surfaces and
- background subtraction based on physical bremsstrahlung modeling
- optimized methods for peak deconvolution and fitting
- optimized least squares peak fit
- optimized single peak deconvolution
- comprehensive and accurate atomic data base for all analytic line series (K, L, M and now also N-lines)
- adjustable carbon coating compensation including calibration tool
- display of non-normalized and normalized results
- calculation of error propagation for statistical and systematic errors.


