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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
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ESPRIT QMap - Quantitative element mapping
- Quantitative map of a sample containing Si, Ti, Cr and Fe
- standardless quantitative element mapping for any number of chemical elements
- selectable scan area, resolution and scan speed (max. 1024 x 1024 pixels at up to 100 pixel/second)
- automatic element identification and predefined or interactively optimized evaluation strategies
- free selection of display color and color intensity for each map
- automatic and interactive contrast and brightness control
- powerful integrated image mixer for multi-color mappings, background subtraction, or image preprocessing
- additive and multiplicative overlaying of electron images, useful for high-resolution element imaging and presentation
- automatic image filter for maps
- separate filters for maps and electron images
- overlaying of markers, legends and other graphics
- interactive determination of lengths, areas, and angles, presented in overlay graphics
- export of maps in all common graphic formats
- support for twain export and windows clip-board
