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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
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ESPRIT HyperMap - Ultra-fast spectral imaging ('PTS' technology)
- Quantification of objects in a HyperMap
- ultra-fast point resolved spectra accumulation and spectral processing
- selectable scan area, resolution and scan speed (up to 1024 x 1024 pixels at 1 µs/pixel)
- data accumulation with frame averaging in a special data base
- image shift correction for long time measurements
- mapping functions
- automatically optimized ROI setting for selected elements according to measurement conditions
- free selection of display colors and color intensity for all maps
- automatic and interactive contrast and brightness control
- powerful integrated image mixer for multi-color mappings, background subtraction, or image preprocessing
- additive and multiplicative electron image overlay for high-resolution element imaging and presentation
- automatic map image filter and separate filters for maps and electron image
- overlay image for markers, legends and free user graphics
- interactive length, area, and angle measurement with result presentation in overlay graphic
- export of single element maps or mix images in all common graphic formats
- support for twain export and windows clip-board
- automatically optimized ROI setting for selected elements according to measurement conditions
- spectral processing
- standardless quantitative element mapping, improved statistics for quantification by virtual reduction of point resolution
- different objects (rectangle, ellipse, polygon) selectable for generation of sum spectra from collected data base, to be carried out simultaneously or after acquisition
- spectra evaluation with all selectable evaluation methods
- result list generation or successive result display
- single object spectra can be individually renamed, saved, processed or evaluated
- spectra and results export functionality using project, report, save file, Excel export, graphic export or windows clipboard
- standardless quantitative element mapping, improved statistics for quantification by virtual reduction of point resolution
- save and load the accumulated data base (spectra, SEM image, element mappings, selected objects with sum spectra)
