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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Electrostatic Force Microscopy Mode (EFM)
- Carbon black aggregates in a rubber matrix visualized by utilizing their electric properties
Electric Force Microscopy (EFM) is a secondary imaging mode derived from TappingMode that measures electric field gradient distribution above the sample surface. This is performed through LiftMode.
In EFM, a voltage may be applied between the tip and the sample. The cantilever's resonance frequency and phase change with the strength of the electric field gradient and are used to construct the EFM image. For example, locally charged domains on the sample surface are mapped in a way that is similar to how MFM maps magnetic domains.
