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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
e–Flash HR EBSD Detector
- e-Flash HR+ EBSD Detector
The e‑FlashHR offers both high resolution and sensitivity. With a resolution of almost 2 Megapixels (1600 x 1200 pixels) it can display finest pattern details. At the same time it offers highest sensitivity. Excellent camera optics warrant minimum pattern distortion. These properties make the e‑FlashHR the tool of choice to tackle difficult tasks in EBSD analysis.
The list of suitable applications includes:
- low beam current operation
- low kV operation
- poorly conducting samples
- nanomaterials
- analysis of pseudosymmetries
- lattice strain investigation
Maximum flexibility in data acquisition
The e‑FlashHR offers maximum flexibility in pattern acquisition. The vertical shift option of the fluorescent screen, provided through the in-situ tilting mechanism,
supports the analysis of comparatively large and very small samples at various working distances, even during microscope operation. The e‑FlashHR features a motorized high precision drive which can be software controlled or manually operated by using a touch panel on the side of the detector encasement. The detector travel of 250 mm permits installation on SEM chambers of all sizes.
Safe to operate
Detector motion monitoring is integrated in a multi-level safety architecture. First of all, a LED indicator shows the current screen position, even if the detector is off. Should for any reason the screen come into contact with the sample or the stage an integrated touch sensor triggers immediate retraction of the detector, so that severe damage is avoided. Screens can be exchanged easily by the user. All required electronics and controls for camera, signal processing and even for the ARGUS™ BSE/FSE detectors are contained in the detector encasement. There are no moving parts or external control units posing safety risks.
The detector head of the e‑FlashHR is slim and chamfered to enable small working and detector-to-sample distances, as well as simultaneous operation with an XFlash® EDS detector.
ARGUS™ FSE/BSE detectors optionally available
e–FlashHR is now optionally available with a set of forescattered electron (FSE) and backscattered electron (BSE) detectors (ARGUS™) – e–FlashHR+. This further increases the versatility of the detector and provides valuable additional information for meaningful and efficient EBSD analysis.
