e–Flash 1000 EBSD Detector

Certain samples or SEM stages are prone to drift phenomena. Therefore short acquisition times can significantly improve pattern quality. The detector is capable of recording 630 patterns/s using 4x4 binning. A recording speed of 850 patterns/s can be attained using 8x8 binning. Due to pattern streaming, speed is independent of the number of phases contained in the sample, warranting that acquisition is always fast and sample contamination and drift are kept at a minimum.

Due to its fast recording capabilities the e^–Flash¹⁰⁰⁰ provides excellent angular resolution even for high speed measurements. Should the task at hand require the in-depth analysis of the sample’s fine structure, the detector can be operated at the full 640x480 resolution and still acquire 210 patterns/s.

The e^–Flash¹⁰⁰⁰ is vertically adjustable, even while the SEM is in operation. This is useful for optimizing the signal during acquisition setup and for adjusting the working distance to the current analytical task. Suitable SEMs will so permit scanning areas of up to 100 mm² without moving the stage. Switching to low working distances and high magnification is therefore also possible without interrupting the session. This feature is also advantageous when setting up simultaneous EBSD and EDS measurements.

The blue LED position indicator shows how far the detector screen is currently inserted into the SEM chamber. An integrated touch sensor triggers immediate retraction of the detector screen with a speed of up to 10 mm/s. Nevertheless, should the screen be damaged, it can easily be replaced by the user.