Language
Search
News
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Band intensity prediction through pattern simulation is an important aid in EBSD analysis
As band positions are characteristic not only for crystal orientations but also phases themselves, it is important to correctly predict the most intense bands. This is an important support for correct phase identification via EBSD. While conventional intensity prediction using kinematic theory simulation works reasonably well for simple structures, like most technical phases are, the situation changes entirely, when looking at more complicated structures. Here kinematic theory fails in many cases, providing wrong intensities.
Comparing kinematic and dynamic simulation with the experimental pattern.
Dynamic EBSD pattern simulation for improved reliability
The solution is to use dynamic theory simulation. This has become a viable option now, as computer performance is ever increasing, supporting complex calculations in shorter time. Bruker Nano has therefore released a pattern simulation software based on dynamic theory for its CrystAlign EBSD system. This software provides the desired reliable intensity predictions for complex phases and much more.
In summary, Bruker's dynamic simulation software offers following possible applications, as listed below.
Fundamental understanding of EBSD pattern formation, e.g.
- reliable prediction of information depth
- influence of energy distribution
Extraction of real band intensities for the
- indexing of crystallographically more complex phases
- prediction of pseudo-symmetries relevant in practice
Generation of reference patterns for
- phase verification and identification
- point group determination (e.g. polar direction)
- lattice strain approximation.

