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- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Single Crystal X-ray Diffraction Documents
Additional and detailed information is available in a number of PDF documents:
Experimental hints and tricks on the structure solution of challenging crystals are found in the application notes. Our brochures contain very detailed information on a particular instrument, it’s most important features and applications. Typical or very spectacular analytical results are found in our lab reports. New components and detailed technical information can be found in our spec sheets.
Those interested in a very detailed discussion and background information concerning the method, an instrument or an component will happily study our technical notes. Typical customers’ feedback is compiled in the section ‘customer testimonials’.


