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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
D8 DISCOVER with GADDS
Anyone whose day-to-day work involves pushing the limits of analytical research and science is dependent on instrumentation that can handle changing requirements.
The flexibility of a diffractometer to handle it all: smallest and largest samples and sample amounts, inhomogeneous or oriented samples of complex shape geometry and possibly with heavy weight is very often the key to be able to perform any analysis at all on a sample.
The D8 DISCOVER with GADDS combines cutting edge X-ray technology of the highest quality in a truly modular system. The D8 DISCOVER with GADDS can analyze an unrivaled variety of samples within a wide range of XRD2 and SAXS applications.
The D8 DISCOVER with GADDS illuminates samples with a tuned monochromatic and parallel X-ray beam. The spatially diffracted X-rays are then measured and evaluated using software from Bruker’s GADDS suite.
Key hardware components of the D8 DISCOVER with GADDS are the patented automated Laser-Video alignment system and the patented HI-STAR area detector:
Both components enable simple precision alignment of sample features for instant analysis in snap-shot or movie mode. Peak to back-ground of the data are close to the theoretical limits because of the unique sensitivity of the HI-STAR detector.
Many high-end accessories are available to accommodate applications ranging from Phase Identification, Phase quantification, Texture, Stress, Single Crystal Diffraction, Small Angle X-ray Scattering, High Throughput Screening, MicroDiffraction, Mapping, Reciprocal Space Mapping, Non Ambient Characterization, High resolution X-ray Diffraction, Reflectometry, Gracing Incidence Diffraction, Indexing and Structure Solution.


