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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
D8 DISCOVER with GADDS
Anyone whose day-to-day work involves pushing the limits of analytical research and science is dependent on instrumentation that can handle changing requirements.
The flexibility of a diffractometer to handle it all: smallest and largest samples and sample amounts, inhomogeneous or oriented samples of complex shape geometry and possibly with heavy weight is very often the key to be able to perform any analysis at all on a sample.
The D8 DISCOVER with GADDS combines cutting edge X-ray technology of the highest quality in a truly modular system. The D8 DISCOVER with GADDS can analyze an unrivaled variety of samples within a wide range of XRD2 and SAXS applications.
The D8 DISCOVER with GADDS illuminates samples with a tuned monochromatic and parallel X-ray beam. The spatially diffracted X-rays are then measured and evaluated using software from Bruker’s GADDS suite.
Key hardware components of the D8 DISCOVER with GADDS are the patented automated Laser-Video alignment system and the patented HI-STAR area detector:
Both components enable simple precision alignment of sample features for instant analysis in snap-shot or movie mode. Peak to back-ground of the data are close to the theoretical limits because of the unique sensitivity of the HI-STAR detector.
Many high-end accessories are available to accommodate applications ranging from Phase Identification, Phase quantification, Texture, Stress, Single Crystal Diffraction, Small Angle X-ray Scattering, High Throughput Screening, MicroDiffraction, Mapping, Reciprocal Space Mapping, Non Ambient Characterization, High resolution X-ray Diffraction, Reflectometry, Gracing Incidence Diffraction, Indexing and Structure Solution.


