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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Dimension® Edge™ Atomic Force Microscope System
- Dimension Edge Atomic Force Microscope System
Serious AFM Capabilities for Every Researcher
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Bruker. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM anywhere else.
Best Value Closed-Loop Dimension AFM
- Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
- Reduced noise and drift bring small-sample imaging performance to large-sample AFM
- Microscope and electronics design enable high image fidelity at moderate cost
Accurate, High-Resolution Results Even Faster
- Linear workflow with visual feedback ensure optimized setup in shortest time
- Camera and stage provide best sample navigation and multi-site measurements
- Seamless transitions from survey to highest resolution deliver fast, accurate results
Solutions for All Applications on Any Sample
- Open stage access accommodates wide variety of experiments and samples
- Optimized AFM modes and techniques meet needs of even advanced applications
- Built-in access to signal routing enables custom measurements
Advanced Nanoscale Capabilities For Beginners and Experts
- Innovative, modular system design provides high performance at moderate cost
- Experiment-selection modes distill decades of AFM expertise into preconfigured settings
- Integrated stage control enables intuitive navigation and powerful stage programming
More Information
Dimension® Edge™ Atomic Force Microscope (PDF brochure)
Bruker´s Support Programs – Nano Surfaces Business (PDF brochure)
