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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
DIFFRACplus TOPAS P
- DIFFRACplus TOPAS P
For applications, which do not require the full features of TOPAS, an additional variant has been developed: TOPAS P.
TOPAS P is designed for profile analysis of powder data without reference to a crystal structure model. This includes Single Line Fitting up to Whole Powder Pattern Fitting, Whole Powder Pattern Decomposition (Pawley and LeBail methods), and Indexing (LSI-Index and LP-Search methods).
Applications include
- Determination of accurate profile parameters (line positions, integrated intensities, peak widths and shapes)
- Standardless microstructure analysis
- Lattice parameter refinement
