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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
DIFFRACplus TOPAS P
- DIFFRACplus TOPAS P
For applications, which do not require the full features of TOPAS, an additional variant has been developed: TOPAS P.
TOPAS P is designed for profile analysis of powder data without reference to a crystal structure model. This includes Single Line Fitting up to Whole Powder Pattern Fitting, Whole Powder Pattern Decomposition (Pawley and LeBail methods), and Indexing (LSI-Index and LP-Search methods).
Applications include
- Determination of accurate profile parameters (line positions, integrated intensities, peak widths and shapes)
- Standardless microstructure analysis
- Lattice parameter refinement
