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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Successful Bruker/MIT Symposium 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Data Integration
Reflections have a three-dimensional intensity distribution. Bruker software is dedicated to preserving this information by acquiring diffraction images in fine slices — a few tenths of a degree apiece. Data collected with wide frames lacks 3D information because spot shapes are reduced to their 2D projections.
Best possible extraction of weak reflection intensities
Our integration software extracts the 3D spot profiles and their intensity distribution, and learns 2theta-dependent profiles from strong, well-defined reflections in your data set.
The software fits the “learnt profiles” to weak reflections using least-squares methods. This provides the best possible extraction of weak reflection intensities. Particularly for challenging samples — where every reflection counts — this approach makes a big difference, and our data quality always prevails.
Our software is the only package that applies profile information for twinned, or split crystal data.
More data integration features
- On-the-fly integration with intensive feedback including integration progress and quality
- 3D reflection profiles
- Multiple component spot overlays


